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產(chǎn)品名稱(chēng):

差分探頭| TDP1500

更新時(shí)間:2024-09-07

產(chǎn)品型號(hào):差分探頭| TDP1500

產(chǎn)品報(bào)價(jià):

產(chǎn)品特點(diǎn):差分探頭| TDP1500 ?3.5 GHz and 1.5 GHz Bandwidth Models – Accurate Measurements for Serial and Digital Applications
?Excellent Common Mode Rejection – Reduces Measurement Errors in Higher Common Environ

差分探頭| TDP1500差分探頭| TDP1500的詳細(xì)資料:

差分探頭| TDP1500

差分探頭| TDP1500

Features & Benefits

  • Outstanding Electrical Performance
    • 3.5 GHz and 1.5 GHz Bandwidth Models – Accurate Measurements for Serial and Digital Applications
    • Excellent Common Mode Rejection – Reduces Measurement Errors in Higher Common Environments
    • Low Capacitive and Resistive Loading – Maintains Signal Fidelity and Reduces DC Biasing Interactions
  • Versatile Mechanical Performance
    • Compact Probe Head Size for Probing Small Geometry Circuit Elements
    • DUT Attachment Accessories enable Connection to Fine-spaced SMDs
    • Robust Design for Reliability
  • Easy to Use
    • Connects Directly to Oscilloscopes with the TekVPI™ Probe Interface
    • Provides Automatic Units Scaling and Readout on the Oscilloscopes Display
    • Easy Access to Probe Comp Box Controls or Oscilloscope Probe Menu Display for Probe Status, Setup Control, and Diagnostic Information
  • Integrated Scope/Probe System
    • Direct Connection to and Powered from the TekVPI™ Oscilloscope Interface (Connects directly to TekVPI scopes without the need of an external power supply, like many competitors require)
    • Single-button Oscilloscope Probe Menu Access
    • Setup and Control from Probe Comp Box or Oscilloscope User Interface
    • AutoZero - Zeros Out Output Offset
    • Remote GPIB/USB Probe Control through the Oscilloscope

Applications

  • Design, Validation, Debugging, and Characterization of Common High-speed Serial Bus Designs:
    • I2C
    • CAN/LIN
    • SPI
    • Serial ATA
    • Ethernet (GbE)
    • USB 2.0
    • FireWire (1394b)
  • Signal Integrity, Jitter, and Timing Analysis
  • Manufacturing Engineering and Test

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